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Design, Analysis and Test of Logic Circuits Under Uncertainty Cover Image E-book E-book

Design, Analysis and Test of Logic Circuits Under Uncertainty [electronic resource] / by Smita Krishnaswamy, Igor L. Markov, John P. Hayes.

Krishnaswamy, Smita. (author.). Markov, Igor L. (author.). Hayes, John P. (author.). SpringerLink (Online service) (Added Author).

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