Search:

Type:

Format:

Library:

Design, Analysis and Test of Logic Circuits Under Uncertainty Cover Image

E-book

E-book

Design, Analysis and Test of Logic Circuits Under Uncertainty [electronic resource] / by Smita Krishnaswamy, Igor L. Markov, John P. Hayes.

Krishnaswamy, Smita. (author.). Markov, Igor L. (author.). Hayes, John P. (author.). SpringerLink (Online service) (Added Author).

Record details

ISBN: 9789048196449
Physical Description: XI, 123 p. 71 illus. online resource.
Publisher: Dordrecht : Springer Netherlands : 2013.

Search for related items by subject

Subject:

Engineering.
Computer hardware.
Computer science.
Logic design.
Operating systems (Computers).
Algebra > Data processing.
Systems engineering.
Engineering.
Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.

Search for related items by series

Add to basket View My Basket Print Email Permalink Disable Highlighting

Electronic resources

► Awards, Reviews, & Suggested Reads

▼ Additional Content

No Content Available

► Shelf Browser

► MARC Record