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001 | 9399 |
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003 | CONS |
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005 | 20131219080647.0 |
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007 | cr nn 008mamaa |
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008 | 100301s2006 xxu| s |||| 0|eng d |
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020 | | . |
‡a9780387372310
‡9978-0-387-37231-0 |
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024 | 7 | . |
‡a10.1007/0-387-37231-8
‡2doi |
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035 | | . |
‡a(DE-He213)978-0-387-37231-0 |
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100 | 1 | . |
‡aFoster, Adam.
‡eauthor. |
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245 | 1 | 0. |
‡aScanning Probe Microscopy
‡h[electronic resource] :
‡bAtomic Scale Engineering by Forces and Currents /
‡cby Adam Foster, Werner Hofer. |
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264 | | 1. |
‡aNew York, NY :
‡bSpringer New York,
‡c2006. |
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300 | | . |
‡aXIV, 281 p. 116 illus.
‡bonline resource. |
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336 | | . |
‡atext
‡btxt
‡2rdacontent |
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337 | | . |
‡acomputer
‡bc
‡2rdamedia |
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338 | | . |
‡aonline resource
‡bcr
‡2rdacarrier |
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347 | | . |
‡atext file
‡bPDF
‡2rda |
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490 | 1 | . |
‡aNanoScience and Technology,
‡x1434-4904 |
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650 | | 0. |
‡aChemistry. |
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650 | | 0. |
‡aMicroscopy. |
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650 | | 0. |
‡aMolecular structure. |
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650 | | 0. |
‡aParticles (Nuclear physics). |
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650 | | 0. |
‡aNanotechnology. |
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650 | | 0. |
‡aSurfaces (Physics). |
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650 | 1 | 4. |
‡aChemistry. |
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650 | 2 | 4. |
‡aCharacterization and Evaluation of Materials. |
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650 | 2 | 4. |
‡aNanotechnology. |
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650 | 2 | 4. |
‡aSurfaces and Interfaces, Thin Films. |
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650 | 2 | 4. |
‡aAtomic and Molecular Structure and Spectra. |
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650 | 2 | 4. |
‡aSolid State Physics and Spectroscopy. |
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650 | 2 | 4. |
‡aBiological Microscopy. |
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700 | 1 | . |
‡aHofer, Werner.
‡eauthor. |
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710 | 2 | . |
‡aSpringerLink (Online service) |
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773 | 0 | . |
‡tSpringer eBooks |
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776 | 0 | 8. |
‡iPrinted edition:
‡z9780387400907 |
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830 | | 0. |
‡aNanoScience and Technology,
‡x1434-4904 |
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856 | 4 | 0. |
‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/0-387-37231-8
‡yTexto completo
‡9CONS |
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950 | | . |
‡aChemistry and Materials Science (Springer-11644) |
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901 | | . |
‡a9399
‡b
‡c9399
‡tbiblio
‡sSystem Local |
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