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E-book
Fundamentals of Nanoscale Film Analysis
Alford, Terry L.
(
author.
).
Feldman, Leonard C.
(
author.
).
Mayer, James W.
(
author.
).
SpringerLink (Online service)
(
Added Author
).
More Details
Record details
ISBN:
9780387292618
Physical Description:
electronic
electronic resource
access
remote
XIV, 326 p. 200 illus. online resource.
Publisher:
Boston, MA : Springer US, 2007.
Search for related items by subject
Subject:
Chemistry
Condensed
matter
Particles (Nuclear
physics
)
Electronics
Nanotechnology
Surfaces (
Physics
)
Chemistry
Characterization and Evaluation of Materials
Surfaces and Interfaces, Thin Films
Nanotechnology
Solid State
Physics
and Spectroscopy
Condensed
Matter
Electronics and Microelectronics, Instrumentation
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