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Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer.
Alford, Terry L.
(
author.
).
Feldman, Leonard C.
(
author.
).
Mayer, James W.
(
author.
).
SpringerLink (Online service)
(
Added Author
).
More Details
Record details
ISBN:
9780387292618
Physical Description:
XIV, 326 p. 200 illus. online resource.
Publisher:
Boston, MA :
Springer US,
2007.
Search for related items by subject
Subject:
Chemistry.
Condensed matter.
Particles (Nuclear physics).
Electronics.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Nanotechnology.
Solid State Physics and Spectroscopy.
Condensed Matter.
Electronics and Microelectronics, Instrumentation.
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