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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces Cover Image E-book E-book

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces [electronic resource] / by Weronika Walkosz.

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  • ISBN: 9781441978172
  • Physical Description: XIII, 108p. 41 illus., 24 illus. in color. digital.
  • Publisher: New York, NY : Springer New York, 2011.
Subject: Microreactors.
Chemistry, Physical organic.
Materials.
Materials Science.
Ceramics, Glass, Composites, Natural Methods.
Spectroscopy and Microscopy.
Physical Chemistry.
Structural Materials.
Atomic/Molecular Structure and Spectra.
Microengineering.

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