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Reliability of Microtechnology Interconnects, Devices and Systems Cover Image E-book E-book

Reliability of Microtechnology Interconnects, Devices and Systems

Liu, Johan. (Author). Salmela, Olli. (Added Author). Sarkka, Jussi. (Added Author). Morris, James E. (Added Author). Tegehall, Per-Erik. (Added Author). Andersson, Cristina. (Added Author). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781441957603
  • Physical Description: electronic
    electronic resource
    access
    remote
    XIII, 204p. 50 illus. digital.
  • Edition: 1.
  • Publisher: New York, NY : Springer New York, 2011.

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Subject: Engineering
System safety
Electronics
Optical materials
Engineering
Electronics and Microelectronics, Instrumentation
Optical and Electronic Materials
Quality Control, Reliability, Safety and Risk
Nanotechnology and Microengineering

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