Reliability of Microtechnology [electronic resource] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.

Liu, Johan. (Author). Salmela, Olli. (Added Author). Sarkka, Jussi. (Added Author). Morris, James E. (Added Author). Tegehall, Per-Erik. (Added Author). Andersson, Cristina. (Added Author). SpringerLink (Online service) (Added Author).

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• ISBN: 9781441957603
• Physical Description: XIII, 204p. 50 illus. digital.
• Edition: 1.
• Publisher: New York, NY : Springer New York, 2011.

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