Reliability of Microtechnology [electronic resource] : Interconnects, Devices and Systems / by Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
E-book
Electronic resources
Record details
- ISBN: 9781441957603
- Physical Description: XIII, 204p. 50 illus. digital.
- Edition: 1.
- Publisher: New York, NY : Springer New York, 2011.