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Reliability of Microtechnology Interconnects, Devices and Systems  Cover Image E-book E-book

Reliability of Microtechnology Interconnects, Devices and Systems

Liu, Johan. (Author). Salmela, Olli. (Added Author). Sarkka, Jussi. (Added Author). Morris, James E. (Added Author). Tegehall, Per-Erik. (Added Author). Andersson, Cristina. (Added Author). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9781441957603
  • Physical Description: electronic
    electronic resource
    access
    remote
    XIII, 204p. 50 illus. digital.
  • Edition: 1.
  • Publisher: New York, NY : Springer New York, 2011.
Subject: Engineering
System safety
Electronics
Optical materials
Engineering
Electronics and Microelectronics, Instrumentation
Optical and Electronic Materials
Quality Control, Reliability, Safety and Risk
Nanotechnology and Microengineering

Electronic resources


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1001 . ‡aLiu, Johan.
24510. ‡aReliability of Microtechnology ‡h[electronic resource] : ‡bInterconnects, Devices and Systems / ‡cby Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
250 . ‡a1.
260 . ‡aNew York, NY : ‡bSpringer New York, ‡c2011.
300 . ‡aXIII, 204p. 50 illus. ‡bdigital.
650 0. ‡aEngineering.
650 0. ‡aSystem safety.
650 0. ‡aElectronics.
650 0. ‡aOptical materials.
65014. ‡aEngineering.
65024. ‡aElectronics and Microelectronics, Instrumentation.
65024. ‡aOptical and Electronic Materials.
65024. ‡aQuality Control, Reliability, Safety and Risk.
65024. ‡aNanotechnology and Microengineering.
7001 . ‡aSalmela, Olli.
7001 . ‡aSarkka, Jussi.
7001 . ‡aMorris, James E.
7001 . ‡aTegehall, Per-Erik.
7001 . ‡aAndersson, Cristina.
7102 . ‡aSpringerLink (Online service)
7730 . ‡tSpringer eBooks
77608. ‡iPrinted edition: ‡z9781441957597
85640. ‡uhttp://dx.doi.org/10.1007/978-1-4419-5760-3 ‡9CONS
950 . ‡aEngineering (Springer-11647)
901 . ‡a3556 ‡b ‡c3556 ‡tbiblio ‡sSystem Local
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