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| 01591nam a22004575i 4500 |
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001 | 3556 |
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003 | CONS |
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005 | 20121026162925.0 |
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007 | cr nn 008mamaa |
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008 | 110204s2011 xxu| s |||| 0|eng d |
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020 | | . |
‡a9781441957603
‡9978-1-4419-5760-3 |
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024 | 7 | . |
‡a10.1007/978-1-4419-5760-3
‡2doi |
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035 | | . |
‡a(DE-He213)978-1-4419-5760-3 |
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050 | | 4. |
‡aTK7800-8360 |
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050 | | 4. |
‡aTK7874-7874.9 |
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072 | | 7. |
‡aTJF
‡2bicssc |
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072 | | 7. |
‡aTEC008000
‡2bisacsh |
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072 | | 7. |
‡aTEC008070
‡2bisacsh |
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100 | 1 | . |
‡aLiu, Johan. |
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245 | 1 | 0. |
‡aReliability of Microtechnology
‡h[electronic resource] :
‡bInterconnects, Devices and Systems /
‡cby Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson. |
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250 | | . |
‡a1. |
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260 | | . |
‡aNew York, NY :
‡bSpringer New York,
‡c2011. |
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300 | | . |
‡aXIII, 204p. 50 illus.
‡bdigital. |
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650 | | 0. |
‡aEngineering. |
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650 | | 0. |
‡aSystem safety. |
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650 | | 0. |
‡aElectronics. |
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650 | | 0. |
‡aOptical materials. |
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650 | 1 | 4. |
‡aEngineering. |
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650 | 2 | 4. |
‡aElectronics and Microelectronics, Instrumentation. |
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650 | 2 | 4. |
‡aOptical and Electronic Materials. |
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650 | 2 | 4. |
‡aQuality Control, Reliability, Safety and Risk. |
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650 | 2 | 4. |
‡aNanotechnology and Microengineering. |
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700 | 1 | . |
‡aSalmela, Olli. |
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700 | 1 | . |
‡aSarkka, Jussi. |
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700 | 1 | . |
‡aMorris, James E. |
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700 | 1 | . |
‡aTegehall, Per-Erik. |
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700 | 1 | . |
‡aAndersson, Cristina. |
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710 | 2 | . |
‡aSpringerLink (Online service) |
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773 | 0 | . |
‡tSpringer eBooks |
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776 | 0 | 8. |
‡iPrinted edition:
‡z9781441957597 |
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856 | 4 | 0. |
‡uhttp://dx.doi.org/10.1007/978-1-4419-5760-3
‡9CONS |
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950 | | . |
‡aEngineering (Springer-11647) |
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901 | | . |
‡a3556
‡b
‡c3556
‡tbiblio
‡sSystem Local |
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