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Design, Analysis and Test of Logic Circuits Under Uncertainty Cover Image E-book E-book

Design, Analysis and Test of Logic Circuits Under Uncertainty

Krishnaswamy, Smita. (author.). Markov, Igor L. (author.). Hayes, John P. (author.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9789048196449
  • Physical Description: electronic
    electronic resource
    access
    remote
    XI, 123 p. 71 illus. online resource.
  • Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Subject: Engineering
Computer hardware
Computer science
Logic design
Operating systems (Computers)
Algebra Data processing
Systems engineering
Engineering
Circuits and Systems
Arithmetic and Logic Structures
Computer Hardware
Performance and Reliability
Logic Design
Symbolic and Algebraic Manipulation

Electronic resources


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24510. ‡aDesign, Analysis and Test of Logic Circuits Under Uncertainty ‡h[electronic resource] / ‡cby Smita Krishnaswamy, Igor L. Markov, John P. Hayes.
264 1. ‡aDordrecht : ‡bSpringer Netherlands : ‡bImprint: Springer, ‡c2013.
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650 0. ‡aLogic design.
650 0. ‡aOperating systems (Computers).
650 0. ‡aAlgebra ‡xData processing.
650 0. ‡aSystems engineering.
65014. ‡aEngineering.
65024. ‡aCircuits and Systems.
65024. ‡aArithmetic and Logic Structures.
65024. ‡aComputer Hardware.
65024. ‡aPerformance and Reliability.
65024. ‡aLogic Design.
65024. ‡aSymbolic and Algebraic Manipulation.
7001 . ‡aMarkov, Igor L. ‡eauthor.
7001 . ‡aHayes, John P. ‡eauthor.
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830 0. ‡aLecture Notes in Electrical Engineering, ‡x1876-1100 ; ‡v115
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