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Trace-Based Post-Silicon Validation for VLSI Circuits
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- ISBN: 9783319005331
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XV, 108 p. 59 illus., 38 illus. in color. online resource. - Publisher: Heidelberg : Springer International Publishing : Imprint: Springer, 2014.
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| Subject: | Engineering Computer science Systems engineering Engineering Circuits and Systems Processor Architectures Semiconductors |
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Electronic resources
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| 001 | 20211 | ||
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| 100 | 1 | . | ‡aLiu, Xiao. ‡eauthor. |
| 245 | 1 | 0. | ‡aTrace-Based Post-Silicon Validation for VLSI Circuits ‡h[electronic resource] / ‡cby Xiao Liu, Qiang Xu. |
| 264 | 1. | ‡aHeidelberg : ‡bSpringer International Publishing : ‡bImprint: Springer, ‡c2014. | |
| 300 | . | ‡aXV, 108 p. 59 illus., 38 illus. in color. ‡bonline resource. | |
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| 490 | 1 | . | ‡aLecture Notes in Electrical Engineering, ‡x1876-1100 ; ‡v252 |
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| 650 | 1 | 4. | ‡aEngineering. |
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| 650 | 2 | 4. | ‡aProcessor Architectures. |
| 650 | 2 | 4. | ‡aSemiconductors. |
| 700 | 1 | . | ‡aXu, Qiang. ‡eauthor. |
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