Trace-Based Post-Silicon Validation for VLSI Circuits [electronic resource] / by Xiao Liu, Qiang Xu.
Record details
- ISBN: 9783319005331
- Physical Description: XV, 108 p. 59 illus., 38 illus. in color. online resource.
- Publisher: Heidelberg : Springer International Publishing : 2014.
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Subject: | Engineering. Computer science. Systems engineering. Engineering. Circuits and Systems. Processor Architectures. Semiconductors. |