Trace-Based Post-Silicon Validation for VLSI Circuits [electronic resource] / by Xiao Liu, Qiang Xu.
Record details
- ISBN: 9783319005331
 - Physical Description: XV, 108 p. 59 illus., 38 illus. in color. online resource.
 - Publisher: Heidelberg : Springer International Publishing : 2014.
 
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| Subject: | Engineering.  Computer science. Systems engineering. Engineering. Circuits and Systems. Processor Architectures. Semiconductors.  | 
                
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Electronic resources
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| 100 | 1 | . | ‡aLiu, Xiao. ‡eauthor. | 
| 245 | 1 | 0. | ‡aTrace-Based Post-Silicon Validation for VLSI Circuits ‡h[electronic resource] / ‡cby Xiao Liu, Qiang Xu. | 
| 264 | 1. | ‡aHeidelberg : ‡bSpringer International Publishing : ‡bImprint: Springer, ‡c2014. | |
| 300 | . | ‡aXV, 108 p. 59 illus., 38 illus. in color. ‡bonline resource. | |
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| 490 | 1 | . | ‡aLecture Notes in Electrical Engineering, ‡x1876-1100 ; ‡v252 | 
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| 650 | 1 | 4. | ‡aEngineering. | 
| 650 | 2 | 4. | ‡aCircuits and Systems. | 
| 650 | 2 | 4. | ‡aProcessor Architectures. | 
| 650 | 2 | 4. | ‡aSemiconductors. | 
| 700 | 1 | . | ‡aXu, Qiang. ‡eauthor. | 
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| 830 | 0. | ‡aLecture Notes in Electrical Engineering, ‡x1876-1100 ; ‡v252 | |
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