Catalog

Record Details

Catalog Search


Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces Cover Image E-book E-book

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [electronic resource] : Application to Rough and Natural Surfaces / by Gerd Kaupp.

Kaupp, Gerd. (author.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9783540284727
  • Physical Description: XII, 292 p. 239 illus. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.

Search for related items by subject

Subject: Chemistry.
Chemistry, Physical organic.
Biochemistry.
Life sciences.
Physical optics.
Nanotechnology.
Chemistry.
Nanotechnology.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.
Physical Chemistry.
Medical Biochemistry.
Life Sciences, general.

Electronic resources

Texto completo


Additional Resources