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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces  Cover Image E-book E-book

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching [electronic resource] : Application to Rough and Natural Surfaces / by Gerd Kaupp.

Kaupp, Gerd. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9783540284727
  • Physical Description: XII, 292 p. 239 illus. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
Subject: Chemistry.
Chemistry, Physical organic.
Biochemistry.
Life sciences.
Physical optics.
Nanotechnology.
Chemistry.
Nanotechnology.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.
Physical Chemistry.
Medical Biochemistry.
Life Sciences, general.

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