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Extreme Statistics in Nanoscale Memory Design Cover Image E-book E-book

Extreme Statistics in Nanoscale Memory Design

Singhee, Amith. (editor.). Rutenbar, Rob A. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781441966063
  • Physical Description: electronic
    electronic resource
    access
    remote
    X, 246 p. online resource.
  • Edition: 1.
  • Publisher: Boston, MA : Springer US : Imprint: Springer, 2010.
Subject: Engineering
Electronics
Systems engineering
Engineering
Circuits and Systems
Electronics and Microelectronics, Instrumentation

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