Extreme Statistics in Nanoscale Memory Design [electronic resource] / edited by Amith Singhee, Rob A. Rutenbar.
Record details
- ISBN: 9781441966063
- Physical Description: X, 246 p. online resource.
- Edition: 1.
- Publisher: Boston, MA : Springer US : 2010.
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Subject: | Engineering. Electronics. Systems engineering. Engineering. Circuits and Systems. Electronics and Microelectronics, Instrumentation. |