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Applied Rasch Measurement: A Book of Exemplars Papers in Honour of John P. Keeves Cover Image E-book E-book

Applied Rasch Measurement: A Book of Exemplars [electronic resource] : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi.

Maclean, Rupert. (editor.). Watanabe, Ryo. (editor.). Baker, Robyn. (editor.). Boediono. (editor.). Cheng, Yin Cheong. (editor.). Duncan, Wendy. (editor.). Keeves, John. (editor.). Mansheng, Zhou. (editor.). Power, Colin. (editor.). Rajput, J. S. (editor.). Thaman, Konai Helu. (editor.). Alagumalai, Sivakumar. (editor.). Curtis, David D. (editor.). Hungi, Njora. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781402030765
  • Physical Description: XVII, 359 p. online resource.
  • Publisher: Dordrecht : Springer Netherlands, 2005.

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Subject: Education.
Distribution (Probability theory).
Comparative education.
Education.
Education (general).
Comparative Education.
Probability Theory and Stochastic Processes.

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