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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability Cover Image E-book E-book

Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

Tehranipoor, Mohammad. (editor.). SpringerLink (Online service) (Added Author).

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Texto completo

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LDR 01702nam a22004695i 4500
00110480
003CONS
00520131217142141.0
007cr nn 008mamaa
008100301s2008 xxu| s |||| 0|eng d
020 . ‡a9780387747477 ‡9978-0-387-74747-7
0247 . ‡a10.1007/978-0-387-74747-7 ‡2doi
035 . ‡a(DE-He213)978-0-387-74747-7
050 4. ‡aTK7888.4
072 7. ‡aTJFC ‡2bicssc
072 7. ‡aTEC008010 ‡2bisacsh
1001 . ‡aTehranipoor, Mohammad. ‡eeditor.
24510. ‡aEmerging Nanotechnologies ‡h[electronic resource] : ‡bTest, Defect Tolerance, and Reliability / ‡cedited by Mohammad Tehranipoor.
264 1. ‡aBoston, MA : ‡bSpringer US, ‡c2008.
300 . ‡bonline resource.
336 . ‡atext ‡btxt ‡2rdacontent
337 . ‡acomputer ‡bc ‡2rdamedia
338 . ‡aonline resource ‡bcr ‡2rdacarrier
347 . ‡atext file ‡bPDF ‡2rda
4901 . ‡aFrontiers in Electronic Testing, ‡x0929-1296 ; ‡v37
650 0. ‡aEngineering.
650 0. ‡aSystem safety.
650 0. ‡aComputer engineering.
650 0. ‡aElectronics.
650 0. ‡aSystems engineering.
650 0. ‡aNanotechnology.
65014. ‡aEngineering.
65024. ‡aCircuits and Systems.
65024. ‡aElectronics and Microelectronics, Instrumentation.
65024. ‡aNanotechnology.
65024. ‡aQuality Control, Reliability, Safety and Risk.
65024. ‡aElectrical Engineering.
7102 . ‡aSpringerLink (Online service)
7730 . ‡tSpringer eBooks
77608. ‡iPrinted edition: ‡z9780387747460
830 0. ‡aFrontiers in Electronic Testing, ‡x0929-1296 ; ‡v37
85640. ‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/978-0-387-74747-7 ‡yTexto completo ‡9CONS
950 . ‡aEngineering (Springer-11647)
901 . ‡a10480 ‡b ‡c10480 ‡tbiblio ‡sSystem Local

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