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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability Cover Image

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Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor.

Tehranipoor, Mohammad. (editor.). SpringerLink (Online service) (Added Author).

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ISBN: 9780387747477
Physical Description: online resource.
Publisher: Boston, MA : Springer US, 2008.

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Engineering.
System safety.
Computer engineering.
Electronics.
Systems engineering.
Nanotechnology.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology.
Quality Control, Reliability, Safety and Risk.
Electrical Engineering.

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