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Emerging Nanotechnologies Test, Defect Tolerance, and Reliability  Cover Image E-book E-book

Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

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  • ISBN: 9780387747477
  • Physical Description: electronic
    electronic resource
    access
    remote
    online resource.
  • Publisher: Boston, MA : Springer US, 2008.
Subject: Engineering
System safety
Computer engineering
Electronics
Systems engineering
Nanotechnology
Engineering
Circuits and Systems
Electronics and Microelectronics, Instrumentation
Nanotechnology
Quality Control, Reliability, Safety and Risk
Electrical Engineering

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