Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
![E-book E-book](http://biblioteca.ipicyt.edu.mx/images/format_icons/icon_format/ebook.png?cafb27)
Electronic resources
Record details
- ISBN: 9783642024177
- Physical Description: X, 258 p. online resource.
- Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.