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Lock-in Thermography [electronic resource] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.

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Record details

  • ISBN: 9783642024177
  • Physical Description: X, 258 p. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
Subject: Physics.
Engineering.
Materials.
Surfaces (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.

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