Reliability of Nanoscale Circuits and Systems [electronic resource] : Methodologies and Circuit Architectures / by Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici.

Stanisavljević, Miloš. (Author). Schmid, Alexandre. (Added Author). Leblebici, Yusuf. (Added Author). SpringerLink (Online service) (Added Author).

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• ISBN: 9781441962171
• Physical Description: XXVII, 195p. 86 illus., 55 illus. in color. digital.
• Publisher: New York, NY : Springer New York, 2011.

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