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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.

Tan, Cher Ming. (Author). Li, Wei. (Added Author). Gan, Zhenghao. (Added Author). Hou, Yuejin. (Added Author). SpringerLink (Online service) (Added Author).

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ISBN: 9780857293107
Physical Description: VII, 150p. 99 illus., 10 illus. in color. digital.
Edition: 1.
Publisher: London : Springer London, 2011.

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Subject:

Engineering.
Differential equations, partial.
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Electronics.
Optical materials.
Engineering.
Quality Control, Reliability, Safety and Risk.
Computational Intelligence.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Partial Differential Equations.

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