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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Tan, Cher Ming. (Author). Li, Wei. (Added Author). Gan, Zhenghao. (Added Author). Hou, Yuejin. (Added Author). SpringerLink (Online service) (Added Author).

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  • ISBN: 9780857293107
  • Physical Description: electronic
    electronic resource
    access
    remote
    VII, 150p. 99 illus., 10 illus. in color. digital.
  • Edition: 1.
  • Publisher: London : Springer London, 2011.
Subject: Engineering
Differential equations, partial
System safety
Electronics
Optical materials
Engineering
Quality Control, Reliability, Safety and Risk
Computational Intelligence
Electronics and Microelectronics, Instrumentation
Optical and Electronic Materials
Partial Differential Equations
Search Results Showing Item 3 of 3

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