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Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors Cover Image E-book E-book

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Im, Seongil. (author.). Chang, Youn-Gyoung. (author.). Kim, Jae Hoon. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9789400763920
  • Physical Description: electronic
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    XI, 101 p. 61 illus. online resource.
  • Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.

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Subject: Physics
Systems engineering
Physics
Electronic Circuits and Devices
Solid State Physics
Circuits and Systems
Optics, Optoelectronics, Plasmonics and Optical Devices
Measurement Science and Instrumentation

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