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Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors Cover Image E-book E-book

Photo-Excited Charge Collection Spectroscopy [electronic resource] : Probing the traps in field-effect transistors / by Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim.

Im, Seongil. (author.). Chang, Youn-Gyoung. (author.). Kim, Jae Hoon. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9789400763920
  • Physical Description: XI, 101 p. 61 illus. online resource.
  • Publisher: Dordrecht : Springer Netherlands : 2013.

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Subject: Physics.
Systems engineering.
Physics.
Electronic Circuits and Devices.
Solid State Physics.
Circuits and Systems.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Measurement Science and Instrumentation.

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