Helium Ion Microscopy [electronic resource] : Principles and Applications / by David C. Joy.

Joy, David C. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9781461486602
• Physical Description: VIII, 64 p. 29 illus., 16 illus. in color. online resource.
• Publisher: New York, NY : Springer New York : 2013.

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