E-book
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Record details
- ISBN: 9783540279228
- Physical Description: XXVI, 489 p. 153 illus. online resource.
- Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
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| Subject: | Physics. Particles (Nuclear physics). Optical materials. Physics. Solid State Physics and Spectroscopy. Optical and Electronic Materials. |
