Lifetime Spectroscopy [electronic resource] : A Method of Defect Characterization in Silicon for Photovoltaic Applications / by Stefan Rein.

Rein, Stefan. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9783540279228
• Physical Description: XXVI, 489 p. 153 illus. online resource.
• Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.

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