E-book
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Record details
- ISBN: 9783540279228
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electronic
electronic resource
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XXVI, 489 p. 153 illus. online resource. - Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
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| Subject: | Physics Particles (Nuclear physics) Optical materials Physics Solid State Physics and Spectroscopy Optical and Electronic Materials |
