Interfacial Compatibility in Microelectronics [electronic resource] : Moving Away from the Trial and Error Approach / by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti.

Laurila, Tomi. (author.). Vuorinen, Vesa. (author.). Paulasto-Kröckel, Mervi. (author.). Turunen, Markus. (author.). Mattila, Toni T. (author.). Kivilahti, Jorma. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9781447124702
• Physical Description: IX, 217p. 128 illus., 15 illus. in color. online resource.
• Publisher: London : Springer London, 2012.

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