Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.
Record details
- ISBN: 9781441909381
- Physical Description: online resource.
- Edition: 1.
- Publisher: Boston, MA : Springer US, 2010.
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Subject: | Engineering. Computer aided design. Systems engineering. Engineering. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design. |