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Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Cover Image E-book E-book

Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel.

Bosio, Alberto. (author.). Dilillo, Luigi. (author.). Girard, Patrick. (author.). Pravossoudovitch, Serge. (author.). Virazel, Arnaud. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781441909381
  • Physical Description: online resource.
  • Edition: 1.
  • Publisher: Boston, MA : Springer US, 2010.

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Subject: Engineering.
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