Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Bosio, Alberto. (author.). Dilillo, Luigi. (author.). Girard, Patrick. (author.). Pravossoudovitch, Serge. (author.). Virazel, Arnaud. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9781441909381
• Physical Description: electronic
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• Edition: 1.
• Publisher: Boston, MA : Springer US, 2010.

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