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Personal Author
Gizopoulos, Dimitris
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Göessel, Michael
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Huisman, Leendert M.
(1)
Kabisatpathy, Prithviraj
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Topic Subject
Engineering
(13)
Circuits and Systems
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Frontiers In Electronic Testing, 40
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Frontiers In Electronic Testing, 42
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1
Soft Errors in Modern Electronic Systems
E-book (2011.)
Nicolaidis, Michael.
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2
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
E-book (2010.)
Wunderlich, Hans-Joachim.
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3
New Methods of Concurrent Checking
E-book (2008.)
Göessel, Michael.
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4
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
E-book (2008.)
Tehranipoor, Mohammad.
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5
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
E-book (2008.)
Pavlov, Andrei.
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6
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
E-book (2007.)
Sachdev, Manoj.
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7
Oscillation-Based Test in Mixed-Signal Circuits
E-book (2006.)
Sánchez, Gloria Huertas.
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8
Gizopoulos / Advances in ElectronicTesting
E-book (2006.)
Gizopoulos, Dimitris.
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9
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
E-book (2006.)
Maichen, Wolfgang.
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10
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
E-book (2006.)
Silva, Francisco.
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Search Results Facets
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Personal Author
Gizopoulos, Dimitris
(1)
Göessel, Michael
(1)
Huisman, Leendert M.
(1)
Kabisatpathy, Prithviraj
(1)
More
Topic Subject
Engineering
(13)
Circuits and Systems
(12)
Systems engineering
(12)
Electronics
(9)
More
Series Title
Frontiers In Electronic Testing, 40
(1)
Frontiers In Electronic Testing, 42
(1)
Frontiers in Electronic Testing, 27
(1)
Frontiers in Electronic Testing, 29
(1)
More
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E-book
(2011.)