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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition Cover Image E-book E-book

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez.

Sachdev, Manoj. (editor.). Gyvez, José Pineda de. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9780387465470
  • Physical Description: XXI, 328 p. online resource.
  • Publisher: Boston, MA : Springer US, 2007.

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Subject: Engineering.
Engineering design.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronic and Computer Engineering.
Engineering Design.
Electronics and Microelectronics, Instrumentation.

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