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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition Cover Image E-book E-book

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Sachdev, Manoj. (editor.). Gyvez, José Pineda de. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9780387465470
  • Physical Description: electronic
    electronic resource
    access
    remote
    XXI, 328 p. online resource.
  • Publisher: Boston, MA : Springer US, 2007.

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Subject: Engineering
Engineering design
Electronics
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Circuits and Systems
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Electronics and Microelectronics, Instrumentation

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