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LDR
| 01237nam a22003375i 4500 |
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| 001 | 4576 |
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| 003 | CONS |
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| 005 | 20121026161158.0 |
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| 007 | cr nn 008mamaa |
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| 008 | 110330s2011 gw | s |||| 0|eng d |
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| 020 | | . |
‡a9783642120121
‡9978-3-642-12012-1 |
|---|
| 024 | 7 | . |
‡a10.1007/978-3-642-12012-1
‡2doi |
|---|
| 035 | | . |
‡a(DE-He213)978-3-642-12012-1 |
|---|
| 050 | | 4. |
‡aTA404.6 |
|---|
| 072 | | 7. |
‡aTGMT
‡2bicssc |
|---|
| 072 | | 7. |
‡aTEC021000
‡2bisacsh |
|---|
| 100 | 1 | . |
‡aLeach, Richard. |
|---|
| 245 | 1 | 0. |
‡aOptical Measurement of Surface Topography
‡h[electronic resource] /
‡cedited by Richard Leach. |
|---|
| 260 | | . |
‡aBerlin, Heidelberg :
‡bSpringer Berlin Heidelberg,
‡c2011. |
|---|
| 300 | | . |
‡aXIV, 326p. 231 illus., 42 illus. in color.
‡bdigital. |
|---|
| 650 | | 0. |
‡aMicrowaves. |
|---|
| 650 | | 0. |
‡aSurfaces (Physics). |
|---|
| 650 | 1 | 4. |
‡aMaterials Science. |
|---|
| 650 | 2 | 4. |
‡aCharacterization and Evaluation of Materials. |
|---|
| 650 | 2 | 4. |
‡aMicrowaves, RF and Optical Engineering. |
|---|
| 650 | 2 | 4. |
‡aMeasurement Science and Instrumentation. |
|---|
| 650 | 2 | 4. |
‡aSurfaces and Interfaces, Thin Films. |
|---|
| 710 | 2 | . |
‡aSpringerLink (Online service) |
|---|
| 773 | 0 | . |
‡tSpringer eBooks |
|---|
| 776 | 0 | 8. |
‡iPrinted edition:
‡z9783642120114 |
|---|
| 856 | 4 | 0. |
‡uhttp://dx.doi.org/10.1007/978-3-642-12012-1
‡9CONS |
|---|
| 950 | | . |
‡aChemistry and Materials Science (Springer-11644) |
|---|
| 901 | | . |
‡a4576
‡b
‡c4576
‡tbiblio
‡sSystem Local |
|---|
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