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Scaning lectron microscopy and x-ray microanalysis Cover Image

Scaning lectron microscopy and x-ray microanalysis / Joseph I. Goldstein [y otros siete].

Goldstein, Joseph I. (Author). Newbury, Dale E. (Added Author). Echlin, Patrick. (Added Author). Joy, David C. (Added Author). Lyman, Charles E. (Added Author). Lifshin, Eric. (Added Author). Sawyer, Linda. (Added Author). Michael, Joseph R. (Added Author).

Record details

  • ISBN: 9780306472923
  • Physical Description: xix, 690 páginas : ilustraciones ; 27 cm.
  • Edition: Third edition.
  • Publisher: New York, NY : Springer, [2013].

Content descriptions

Bibliography, etc. Note:
Incluye bibliografía e índice.
Immediate Source of Acquisition Note:
IPICYT ; Compra por proyecto CONACYT-3953 Programa de Fortalecimiento Académico del PNCP/R.2752 ; 2014.
Language Note:
En inglés.

Search for related items by subject

Subject: Microscopía electrónica de barrido.
Microanálisis de rayos X.

Available copies

  • 1 of 1 copy available at IPICYT.

Holds

  • 0 current holds with 1 total copy.
Show Only Available Copies
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Biblioteca Ipicyt QH212.S3G6 S2 2003 LCI00820 Coleccion General Available -

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