Photomodulated Optical Reflectance A Fundamental Study Aimed at Non-Destructive Carrier Profiling in Silicon
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- ISBN: 9783642301087
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XXIII, 201 p. 74 illus., 23 illus. in color. online resource. - Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
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Subject: | Physics Physics Semiconductors Applied and Technical Physics |