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| 01248nam a22003615i 4500 |
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| 001 | 4010 |
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| 003 | CONS |
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| 005 | 20121024151003.0 |
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| 007 | cr nn 008mamaa |
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| 008 | 110725s2011 xxu| s |||| 0|eng d |
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| 020 | | . |
‡a9781441995834
‡9978-1-4419-9583-4 |
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| 024 | 7 | . |
‡a10.1007/978-1-4419-9583-4
‡2doi |
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| 035 | | . |
‡a(DE-He213)978-1-4419-9583-4 |
|---|
| 050 | | 4. |
‡aTA404.6 |
|---|
| 072 | | 7. |
‡aTGMT
‡2bicssc |
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| 072 | | 7. |
‡aTEC021000
‡2bisacsh |
|---|
| 100 | 1 | . |
‡aEgerton, R.F. |
|---|
| 245 | 1 | 0. |
‡aElectron Energy-Loss Spectroscopy in the Electron Microscope
‡h[electronic resource] /
‡cby R.F. Egerton. |
|---|
| 260 | | . |
‡aBoston, MA :
‡bSpringer US,
‡c2011. |
|---|
| 300 | | . |
‡aXII, 491p. 215 illus., 26 illus. in color.
‡bdigital. |
|---|
| 650 | | 0. |
‡aSpectroscopy. |
|---|
| 650 | | 0. |
‡aNanotechnology. |
|---|
| 650 | | 0. |
‡aSurfaces (Physics). |
|---|
| 650 | 1 | 4. |
‡aMaterials Science. |
|---|
| 650 | 2 | 4. |
‡aCharacterization and Evaluation of Materials. |
|---|
| 650 | 2 | 4. |
‡aSolid State Physics. |
|---|
| 650 | 2 | 4. |
‡aSpectroscopy and Microscopy. |
|---|
| 650 | 2 | 4. |
‡aSpectroscopy/Spectrometry. |
|---|
| 650 | 2 | 4. |
‡aNanotechnology. |
|---|
| 710 | 2 | . |
‡aSpringerLink (Online service) |
|---|
| 773 | 0 | . |
‡tSpringer eBooks |
|---|
| 776 | 0 | 8. |
‡iPrinted edition:
‡z9781441995827 |
|---|
| 856 | 4 | 0. |
‡uhttp://dx.doi.org/10.1007/978-1-4419-9583-4
‡9CONS |
|---|
| 950 | | . |
‡aChemistry and Materials Science (Springer-11644) |
|---|
| 901 | | . |
‡a4010
‡b
‡c4010
‡tbiblio
‡sSystem Local |
|---|
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