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Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials Cover Image E-book E-book

Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

Breitenstein, Otwin. (author.). Warta, Wilhelm. (author.). Langenkamp, Martin. (author.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9783642024177
  • Physical Description: electronic
    electronic resource
    access
    remote
    X, 258 p. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.

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Subject: Physics
Engineering
Materials
Surfaces (Physics)
Physics
Optics, Optoelectronics, Plasmonics and Optical Devices
Characterization and Evaluation of Materials
Engineering, general
Structural Materials

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65024. ‡aCharacterization and Evaluation of Materials.
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