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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Cover Image E-book E-book

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.

Tan, Cher Ming. (Author). Li, Wei. (Added Author). Gan, Zhenghao. (Added Author). Hou, Yuejin. (Added Author). SpringerLink (Online service) (Added Author).

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LDR 01709nam a22004815i 4500
0013216
003CONS
00520121026161043.0
007cr nn 008mamaa
008110326s2011 xxk| s |||| 0|eng d
020 . ‡a9780857293107 ‡9978-0-85729-310-7
0247 . ‡a10.1007/978-0-85729-310-7 ‡2doi
035 . ‡a(DE-He213)978-0-85729-310-7
050 4. ‡aTA169.7
050 4. ‡aT55-T55.3
050 4. ‡aTA403.6
072 7. ‡aTGPR ‡2bicssc
072 7. ‡aTEC032000 ‡2bisacsh
1001 . ‡aTan, Cher Ming.
24510. ‡aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections ‡h[electronic resource] / ‡cby Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.
250 . ‡a1.
260 . ‡aLondon : ‡bSpringer London, ‡c2011.
300 . ‡aVII, 150p. 99 illus., 10 illus. in color. ‡bdigital.
4900 . ‡aSpringer Series in Reliability Engineering, ‡x1614-7839
650 0. ‡aEngineering.
650 0. ‡aDifferential equations, partial.
650 0. ‡aSystem safety.
650 0. ‡aElectronics.
650 0. ‡aOptical materials.
65014. ‡aEngineering.
65024. ‡aQuality Control, Reliability, Safety and Risk.
65024. ‡aComputational Intelligence.
65024. ‡aElectronics and Microelectronics, Instrumentation.
65024. ‡aOptical and Electronic Materials.
65024. ‡aPartial Differential Equations.
7001 . ‡aLi, Wei.
7001 . ‡aGan, Zhenghao.
7001 . ‡aHou, Yuejin.
7102 . ‡aSpringerLink (Online service)
7730 . ‡tSpringer eBooks
77608. ‡iPrinted edition: ‡z9780857293091
830 0. ‡aSpringer Series in Reliability Engineering, ‡x1614-7839
85640. ‡uhttp://dx.doi.org/10.1007/978-0-85729-310-7 ‡9CONS
950 . ‡aEngineering (Springer-11647)
901 . ‡a3216 ‡b ‡c3216 ‡tbiblio ‡sSystem Local

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