E-book
Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes
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- ISBN: 9784431544487
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electronic resource
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XI, 125 p. 86 illus., 3 illus. in color. online resource. - Publisher: Tokyo : Springer Japan : Imprint: Springer, 2014.
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| Subject: | Physics Engineering Physics Spectroscopy and Microscopy Nanotechnology and Microengineering Machinery and Machine Elements Measurement Science and Instrumentation |
