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Electromigration Modeling at Circuit Layout Level Cover Image E-book E-book

Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He.

Tan, Cher Ming. (author.). He, Feifei. (author.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9789814451215
  • Physical Description: IX, 103 p. 75 illus., 2 illus. in color. online resource.
  • Publisher: Singapore : Springer Singapore : 2013.
Subject: Engineering.
System safety.
Engineering.
Quality Control, Reliability, Safety and Risk.
Electronic Circuits and Devices.
Atomic, Molecular, Optical and Plasma Physics.

Electronic resources


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24510. ‡aElectromigration Modeling at Circuit Layout Level ‡h[electronic resource] / ‡cby Cher Ming Tan, Feifei He.
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65024. ‡aElectronic Circuits and Devices.
65024. ‡aAtomic, Molecular, Optical and Plasma Physics.
7001 . ‡aHe, Feifei. ‡eauthor.
7102 . ‡aSpringerLink (Online service)
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