E-book
Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He.
Record details
- ISBN: 9789814451215
- Physical Description: IX, 103 p. 75 illus., 2 illus. in color. online resource.
- Publisher: Singapore : Springer Singapore : 2013.
Search for related items by subject
| Subject: | Engineering. System safety. Engineering. Quality Control, Reliability, Safety and Risk. Electronic Circuits and Devices. Atomic, Molecular, Optical and Plasma Physics. |
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Electronic resources
| Introduction | ||
| 3D Circuit Model Construction and Simulation | ||
| Comparison of EM Performance in Circuit Structure and Test Structure | ||
| Interconnect EM Reliability Modeling at Circuit Layout Level | ||
| Conclusion. |
