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Helium Ion Microscopy [electronic resource] : Principles and Applications / by David C. Joy.

Record details

ISBN: 9781461486602
Physical Description: VIII, 64 p. 29 illus., 16 illus. in color. online resource.
Publisher: New York, NY : Springer New York : 2013.

Subject:

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LDR	01634nam a22004335i 4500
001	23556
003	CONS
005	20130919033844.0
007	cr nn 008mamaa
008	130913s2013 xxu\| s \|\|\|\| 0\|eng d
020		.	‡a9781461486602 ‡9978-1-4614-8660-2
024	7	.	‡a10.1007/978-1-4614-8660-2 ‡2doi
035		.	‡a(DE-He213)978-1-4614-8660-2
050		4.	‡aTA404.6
072		7.	‡aTGMT ‡2bicssc
072		7.	‡aTEC021000 ‡2bisacsh
100	1	.	‡aJoy, David C. ‡eauthor.
245	1	0.	‡aHelium Ion Microscopy ‡h[electronic resource] : ‡bPrinciples and Applications / ‡cby David C. Joy.
264		1.	‡aNew York, NY : ‡bSpringer New York : ‡bImprint: Springer, ‡c2013.
300		.	‡aVIII, 64 p. 29 illus., 16 illus. in color. ‡bonline resource.
336		.	‡atext ‡btxt ‡2rdacontent
337		.	‡acomputer ‡bc ‡2rdamedia
338		.	‡aonline resource ‡bcr ‡2rdacarrier
347		.	‡atext file ‡bPDF ‡2rda
490	1	.	‡aSpringerBriefs in Materials, ‡x2192-1091
650		0.	‡aSpectroscopy.
650		0.	‡aNanotechnology.
650		0.	‡aSurfaces (Physics).
650	1	4.	‡aMaterials Science.
650	2	4.	‡aCharacterization and Evaluation of Materials.
650	2	4.	‡aSpectroscopy and Microscopy.
650	2	4.	‡aSpectroscopy/Spectrometry.
650	2	4.	‡aNanotechnology.
650	2	4.	‡aNanoscale Science and Technology.
710	2	.	‡aSpringerLink (Online service)
773	0	.	‡tSpringer eBooks
776	0	8.	‡iPrinted edition: ‡z9781461486596
830		0.	‡aSpringerBriefs in Materials, ‡x2192-1091
856	4	0.	‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/978-1-4614-8660-2 ‡yTexto completo ‡9CONS
950		.	‡aChemistry and Materials Science (Springer-11644)
901		.	‡a23556 ‡b ‡c23556 ‡tbiblio ‡sSystem Local