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Helium Ion Microscopy Principles and Applications Cover Image E-book E-book

Helium Ion Microscopy Principles and Applications

Joy, David C. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781461486602
  • Physical Description: electronic
    electronic resource
    access
    remote
    VIII, 64 p. 29 illus., 16 illus. in color. online resource.
  • Publisher: New York, NY : Springer New York : Imprint: Springer, 2013.

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Subject: Spectroscopy
Nanotechnology
Surfaces (Physics)
Materials Science
Characterization and Evaluation of Materials
Spectroscopy and Microscopy
Spectroscopy/Spectrometry
Nanotechnology
Nanoscale Science and Technology

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