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Helium Ion Microscopy Principles and Applications Cover Image E-book E-book

Helium Ion Microscopy [electronic resource] : Principles and Applications / by David C. Joy.

Joy, David C. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781461486602
  • Physical Description: VIII, 64 p. 29 illus., 16 illus. in color. online resource.
  • Publisher: New York, NY : Springer New York : 2013.

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Subject: Spectroscopy.
Nanotechnology.
Surfaces (Physics).
Materials Science.
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Spectroscopy/Spectrometry.
Nanotechnology.
Nanoscale Science and Technology.

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